year	title		publication
2024	An Empirical Fault Vulnerability Exploration of ReRAM-Based Process-in-Memory CNN Accelerators		Journal
Authors	Aniseh Dorostkar, Hamed Farbeh, Hamid R. Zarandi
published at	IEEE Transactions on Reliability, 2024.

year	title		publication
2024	A Low-Cost Fault-Tolerant Racetrack Cache Based on Data Compression		Journal
Authors	Elham Cheshmikhani, Fatemeh Shokouhinia, Hamed Farbeh
published at	IEEE Transactions on Circuits and Systems II: Express Briefs, 1-5

year	title		publication
2024	Multi-Retention STT-MRAM Architectures for IoT: Evaluating the Impact of Retention Levels and Memory Mapping Schemes		Journal
Authors	Belal Jahannia, Seyed Ali Ghasemi, Hamed Farbeh
published at	IEEE Access, 12, 26562 - 26580.